Structure and Transport Characterization

 

PPMS.bmpPhysical Properties Measurement System

Manufacturer: LQT Quantum

Model: QD-PPMS-9-EC2

Location: LFO93

Description: For high-precision transport property measurements. Equipped with EverCool-II cryogen-free cooling system and 9 Tesla magnet; Temperature range is 1.9-400 K,












​afm.bmpDimension ICON Scanning Probe Microscope

Manufacturer: Bruker

Model: ICON-PKG

Location: LFO93

Description: For microscopic characterization of materials especially thin films.

Equipped with different application modules such as MFM, EFM, PFM, Peak force QNM

and Nanolithography, and a thermal platform works from -40 to 250 degree.






LCR meter.bmp

2Mhz Precision LCR Meter

Manufacturer: Agilent

Model: E4980A

Location: LFO93

Description: For high-precision impedance measurements; The frequency range is 20 Hz to 2 MHz; 0.05% basic accuracy with superior measurement repeatability ,







keithley_4200_scs.pngPrecision Multiferroic Tester

Manufacturer: Radiant Technology

Model: multiferroic tester

Location: LFO93

Description: For ferroelectric and electric characterizations. Working voltage ranges from -200V to 200V; frequency ranges from 0.1 Hz to 100 kHz.





keithley_4200_scs.pngSemiconductor Characterization System

Manufacturer: Keithley

Model: Keithley4200-SCS

Location: LFO93

Description: For electric and dielectric characterizations of devices such as resistor, transistor and capacitors. Equipped with three application modules including 4200 SMU (3) for quasistatic electric test, 4210 CVU (1) for dielectric test and 4225 PMU (1) for ultrafast I-V test.





 

keithley_4200_scs.pngPowder X-ray Diffraction System

Manufacturer: Bruker

Model: D8-Advance

Location: ANIC Core Lab

Description: For characterizing the crystal structure of polycrystal ceramic or powder samples. Equipped by high power Cu X-ray tube.














keithley_4200_scs.pngThin Film X-ray Diffraction System

Manufacturer: Bruker

Model: D8-Discover

Location: ANIC Core Lab

Description: For characterizing the crystal structure of Single crystal and epitaxial thin films. Equipped by high power Cu X-ray tube and double crystal Ge monochromator.













keithley_4200_scs.pngMagnetic Property Measurement System

Manufacturer: Quantum Design

Model: MPMS

Location: ANIC Core Lab

Description: For high-precision magnetic property measurements. Equipped with EverCool cryogen-free cooling system and 7 Tesla magnet; Temperature range is 1.9-400 K,











keithley_4200_scs.pngTransmission Electron Microscope

Manufacturer: FEI COMPANY

Model: Titan Mono-Probe Cs

Location: ANIC Core Lab

Description: Titan Mono-Probe Cs is a state-of-the art Transmission Electron Microscope (TEM). It’s top of the line Titan from FEI. It is equipped with a monochromator and a probe Cs corrector (Cs: 1.25 mm), which enables the sub-angstrom imaging capability at both TEM and STEM modes as well as ultrahigh energy resolution chemical analysis capability.






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